Test firm intros DFT systemNews from E-InSiteTeseda, an IC-test equipment startup from Portland, Oregon, has introduced the Teseda Validator 500, which it claims is the first design-for-test (DFT) ...
Teseda (Portland, OR; www.teseda.com) has announced the new release of the V500 DFT-Focused engineering test system. New features and options include support for delay (AC) scan and IDDQ test ...
Recently, DFT elements have begun to show up in more and more large complex SoC devices. The concept of scan no longer raises the objections of overhead to the extent it used to. Yet, customers and ...
The V500 DFT-focused engineering test system includes new features and options for a wider range of applications. It includes optional support for delay (ac) scan to 30 MHz; I DDQ test methodologies; ...
SAN JOSE, Calif., Oct 19, 2005-- SynTest Technologies, Inc., a leading supplier of Design-for-Test (DFT) tools, was granted 33 claims on Oct. 11, 2005 under United States Patent # 6,954,887 for its ...
What if all the DFT verification on your next big chip could be completed before tape-out? This “shift-left” of DFT verification would eliminate the need for shortcuts in verification and allow for ...
A system for detaining asylum seekers while their claims are speedily assessed has been temporarily suspended after it was ruled unlawful last month. The Home Office decided to halt the Detained Fast ...
Recently, DFT elements have begun to show up in more and more large complex SoC devices. The concept of scan no longer raises the objections of overhead to the extent it used to. Yet, customers and ...