Reliability testing has long served as a method of ensuring that semiconductor devices maintain their desired performance over a given lifetime. As IC manufacturers continue to introduce new and ...

This is a preview. Log in through your library . Abstract A multivariate distribution for describing the life-lengths of the components of a system which operates in an environment that is different ...

This paper investigates the solution by integer programming of reliability optimization problems which are subject to linear and nonlinear separable restraints. In particular, the following problems ...

STAr Technologies, a provider of semiconductor test solutions, releases a new Sagittarius-WLR integrated platform for advanced Wafer-Level Reliability (WLR) tests. Sagittarius-WLR is developed to ...

Decreased system reliability due to overloaded power supplies is a common engineering challenge. In this Q&A-style article submitted by Allied Electronic & Automation, David Norton, technical ...

In the past, during the concept phase of a design, system models have typically lacked information regarding reliability. If at all, reliability was addressed late in the design phase shortly before ...