The Eccentric plunger probe employs a patented biasing design that improves the reliability and longevity of the probe by reducing resistance and probe wear. By drilling the plunger’s spring cavity in ...
Exploiting a proven spring-probe design, the QUAD-4 test clip ensures secure, non-evasive contact for Micron TSOPII packaged ICs. It is designed to clip over surface-mounted DDR SDRAM memories in the ...
High-frequency center-probe test sockets are available for ball grid array, chip-scale, and micro land frame packages with a lead pitch of 0.30 mm. Features include a four-point crown or sharp-point ...
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