Loaded board testing pays for itself by reducing field returns and bone-pile scrap. You seldom read an article about PCBs or semiconductors without encountering test-related phrases and acronyms. Cost ...

Wireless fixtures for in-circuit testing (ICT) have been available for more than 15 years and have no equal in testing high node-count complex circuit boards. However, there are other hidden ...

I noted in a 2005 column (see "Current compression test methods" under “Editor's Pick,” at top right) that there are three basic methods of loading a composite material test specimen in compression: ...

The Iosipescu Shear and the V-Notched Rail Shear test methods are ASTM standards, ASTM D 5379 1 and D 7078 2, respectively. Both are used primarily for in-plane shear testing, but each can be used for ...

Test and programming fixtures are great time-savers for anyone who needs to deal with more than a handful of PCBs. Instead of plugging in connectors (or awkwardly holding probe tips or wires) to ...

This article summarizes the content of a paper jointly developed and presented by Advantest and Infineon at TestConX 2022. Device under test (DUT) fixtures for ATE systems pose several verification ...

The industry’s insatiable need for power in high-performance computing (HPC) is creating problems for test cells, which need to deliver very high currents at very consistent voltage levels through the ...

In-circuit test can exercise components individually. Boundary-scan test can evaluate components as well as interconnects. Functional test can test for faults that may have escaped other stages while ...