FormFactor has introduced the PH150XP wafer probe card, an extension of the company's PH150 product family for DRAM wafer testing. The PH150XP offers several yield and throughput enhancements to ...
FormFactor has introduced DC-Boost, an advanced TRE test technology to increase probe test capacity. The new wafer-probe-card capability enables more efficient use of tester channels on test equipment ...
New market study finds that the top six manufacturers of Wafer Test Probe Card occupied nearly 72.09% global market share. LEWES, DELAWARE, UNITED STATES, November 30 ...
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