Balancing yield and test is essential to semiconductor manufacturing, but it’s becoming harder to determine how much weight to give one versus the other as chips become more specialized for different ...

Diagnosis-driven yield analysis identifies the cause of systematic yield loss to speed yield ramp on new processes and improves yield on mature processes. Finding the root cause of yield loss is ...

JA Solar and TÜV Rheinland have reported the results of a one-year energy yield test at the national outdoor yield test base for PV products in Qionghai, Hainan, China. The test aimed to study and ...