Deep learning-based defect classification and detection in SEM images
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Struggling to prepare thin films for defect analysis using TEM? This webinar presents an alternative— cECCI with a ZEISS FE-SEM. Discover how this new imaging technique eliminates complex sample preparation and enables you to study defects such as dislocations and stacking faults in bulk samples with clarity and efficiency. 🎥 Watch the webinar now | ZEISS Microscopy
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Struggling to prepare thin films for defect analysis using TEM? This …
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When silicon chips are fabricated, defects in materials (e.g., ... | Filo
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